Equipment for Sale

Veeco NT9100

Accurate surface topography with sub-nanometer vertical resolution across all magnifications. Motorized, programmable stage with stitching for large-area measurements. Non-contact 3D surface metrology with dual-LED illumination and full 2D/3D data analysis & visualization.

Objectives: standard 5X, 10X, 20X, 50X on a motorized turret — magnification from 0.75X to 100X. Field of view: 0.55x, 0.75x, 1x, 1.5x, 2x. Automated 100mm Z-axis with ±6° tip/tilt stage and 100mm XY travel.

Candela OSA 5100

The KLA Candela Optical Surface Analyzer (OSA) 5100 is a semiconductor and photovoltaic wafer metrology system that analyzes surface properties like thickness, uniformity, and texture using advanced optical techniques.

Veeco NT1100

A non-contact 3D surface metrology system using white light interferometry to measure surfaces from sub-nanometer roughness to millimeter-high steps. Offers two measurement modes — VSI and PSI — with different resolutions and ranges, and a variety of objectives for different magnifications.

Dektak 150

A surface profiler with a 150mm (6-inch) maximum sample size, a 55mm scan length, and a vertical resolution down to 1 Ångström at its best. Uses a contact stylus to measure surface roughness and step heights, with a vertical range of up to 524µm.

Quesant 250 AFM

A surface imaging system with a 6″ × 6″ maximum sample stage, a 65mm maximum sample height, and a motorized Z-translation stage. Features an integrated 200X video microscope for sample viewing.

Wyko NT2000

An automated optical surface profiler designed for semiconductor manufacturing, using non-contact interferometry for 3D surface topography measurement.